Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...

Carbon nanotube (CNT) probes have emerged as a transformative advance in atomic force microscopy, combining sub-nanometre tip radii with exceptional mechanical resilience. Their high aspect ratio ...

AFM can provide new insights into 2D materials to better understand their potential applications. What are the key characteristics and importance of 2D materials like graphene and hexagonal boron ...

High-speed atomic force microscopy (HS-AFM) is the only experimental technique to directly watch proteins in dynamic action. However, as a surface scanning technique with limited spatial resolution, ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

BudgetSensors® Ultra Sharp AFM tips feature a single, 1nm ultra sharp hydrophobic diamond-like carbon extra tip at the apex of gold coated silicon etched AFM probes. Available on tapping, soft tapping ...