The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term ...

•Average fault coverage for randomly generated test vectors was 60% or better depending on the type of circuit and the number of vectors applied (Max 98% or better). •Fault coverage for test vectors ...

This is the second part of a two-part discussion (Part 1 appeared in August) in which the author considers fault-coverage analysis and simulation for full-scan testing of ASIC designs. These elements ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

It's popular among the highly technical trades, but a fault tree can also pinpoint problems within a small manufacturing operation. A properly done fault tree analysis, or FTA, shows relations between ...