In this modern era, design complexity and size of the SOC is increasing at a very fast pace. Designers are also moving to lower technology nodes to achieve the higher performance targets. There are ...

Logic built-in self test (LBIST) is being used in SoCs for increasing safety and to provide a self-testing capability. LBIST design works on the principle of STUMPS architecture. STUMPS is a nested ...

Logic built-in self test (LBIST) allows hardware to test its own operation. There is no need for any external hardware or test equipment. LBIST is a “must have” feature for safety compliant SoCs. But ...

How functional safety analysis can be used to achieve a careful tradeoff of several metrics for efficient use of safety mechanisms. Functional safety requirements for safety-critical applications are ...

A new technical paper titled “A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin” was written by researchers at Infineon Technologies, University of Bremen ...

For testing complex chip designs it makes sense to combine the two most common test methodologies -logic built-in self-test (LBIST) and automatic test pattern generation (ATPG), writes Amer ...

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...