Optimize SEM analysis with Broad Ion Beam Milling, a cutting-edge technique for preparing intricate specimens, ensuring ...

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...

Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...

Ion milling systems provide precise, artifact-free preparation of complex samples, enabling high quality analysis in electron ...

The proteins that make up our cells hold within an entire world of information, which, when unlocked, can give us insights into the origins of many essential biological phenomena. This information is ...

Single-cell proteomics provides information about a cell at its protein level, which can prove useful for anticancer drug resistance and cell differentiation research. However, current proteomics ...

Observation of Live Ticks (Haemaphysalis flava) by Scanning Electron Microscopy under High Vacuum Pressure, PLoS One “Scanning electron microscopes (SEM), which image sample surfaces by scanning with ...

The new microPREP L system will be featured at the upcoming International Symposium for Testing and Failure Analysis (ISTFA), ...