Optimize SEM analysis with Broad Ion Beam Milling, a cutting-edge technique for preparing intricate specimens, ensuring ...

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...

Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...

The proteins that make up our cells hold within an entire world of information, which, when unlocked, can give us insights into the origins of many essential biological phenomena. This information is ...

Clean, careful, targeted sample preparation is essential for obtaining valuable information from mass spectrometry experiments. A well-designed sample preparation protocol must avoid contamination by ...

The new microPREP L system will be featured at the upcoming International Symposium for Testing and Failure Analysis (ISTFA), ...

As scientists, we can be very uncomfortable with the concept of “good enough”. It feels contrary to everything that we are trained to do—to keep meticulous notes and take our time testing and ...