Machine Design

Wafer-thin NEW INFRARED TOOL MEASURES SILICON WAFER THICKNESS

To meet its quality control roadmap goals by 2010, researchers at the National Institute of Standards and Technology (NIST) developed the Improved Interferometer To meet its quality control roadmap ...
Semiconductor Engineering

Non-destructive Thickness Characterisation of 3D Multilayer Semiconductor Devices Using Optical Spectral Measurements and Machine Learning

“Three-dimensional (3D) semiconductor devices can address the limitations of traditional two-dimensional (2D) devices by expanding the integration space in the vertical direction. A 3D NOT-AND (NAND) ...
Machine Design

Measuring Coating Thickness

The instrument displays 20, 60, and 85° readings for high-gloss to matte finishes. Its Fe/NFe (magnetic/ nonmagnetic) sensor measures thickness (0 to 1,000 μm) on steel as well as aluminum, and it ...
The Financial Express

Seidenader DS12+ thickness sorting machine redesigned

Seidenader’s automatic DS12+ thickness sorting machine has been re-designed for more user-friendly handling and lower maintenance. Additional practical design details and a touchscreen (HMI) have ...