In semiconductor manufacturing, especially in electrical test data, but also in other parameters, there are often sets of parameters that are very highly correlated. Even a change in the correlation ...

We introduce a new approach aiming at computing approximate optimal designs for multivariate polynomial regressions on compact (semialgebraic) design spaces. We use the moment-sum-of-squares hierarchy ...

We incorporate a reduced-rank envelope in an elliptical multivariate linear regression to improve the efficiency of estimation. The reduced-rank envelope model takes advantage of both a reduced-rank ...